Research EDA Feature size of the CMOS transistor keeps going down to reduce the area and power of integrated circuits. A lot of side effects come along with the scaling down, how to build up a reliable and low power system based on un-reliable nano-scale devices become a critical problem. We focus on three main topics: Leakage power and reliability (especially aging) aware design methodology Fast/Parallel Circuit Simulation Heterogenous Integration for 3D IC.