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Papers共 113 篇Author StatisticsCo-AuthorSimilar Experts

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ML-Based Analysis of In-Situ Backscatter Electron Detection for Quality Assurance During Additive Manufacturing
Temilola Gbadamosi-Adeniyi, Trevor McDonald, Dylan Peverall, Emmanuel Amoako,Christopher Tassone, Scott Ferguson,Tim Horn
2024 JOINT INTERNATIONAL VACUUM ELECTRONICS CONFERENCE AND INTERNATIONAL VACUUM ELECTRON SOURCES CONFERENCE, IVEC + IVESC 2024 (2024)
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Author Statistics

#Papers: 113

#Citation: 6652

H-Index: 41

G-Index: 81

Sociability: 6

Diversity: 3

Activity: 34

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