Daniel Krüger

Daniel Krüger (Graduate Student Member, IEEE) received the B.Sc. and M.Sc. degrees in electrical engineering from the University of Stuttgart, Stuttgart, Germany, in 2016 and 2018, respectively. He is currently working toward the Ph.D. degree with the Institute of Smart Sensors, University of Stuttgart. He is also a Research Fellow with Donhee Ham Lab, Harvard University, Cambridge, MA, USA. His research interests include mixed-signal ICs for nuclear magnetic resonance, electron spin resonance, and biomedical applications.