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Papers共 12 篇Author StatisticsCo-AuthorSimilar Experts

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Preliminary Results from Heavy-Ion Irradiation of the Xilinx Versal ACAP
David Lee,Gregory Allen,Matthew Cannon, Hunter Earnest, Paul Thelen,Nathaniel Dodds,Jeffrey McCasland, Carol Chen
Proposed for presentation at the Single Event Effects Symposium and Military and Aerospace Programmable Logic Devices Workshop held August 31-September 2, 2021 in Virtual, Virtual (2021)
Cited2Views0Bibtex
2
0
Impacts of Substrate Thinning on FPGA Performance and Reliability
Darin Leonhardt,Thomas Beechem,Matthew Cannon,Nathaniel Dodds, Matthew Fellows, Thomas Grzybowski,Gad Haase, Thomas LeBoeuf,David Lee,William Rice
Proceedings - International Symposium for Testing and Failure Analysis (2021)
Cited1Views0Bibtex
1
0
Single-Event Characterization of 16 Nm FinFET Xilinx UltraScale+ Devices with Heavy Ion and Neutron Irradiation
David S. Lee,Michael King, William Evans,Matthew Cannon,Andres Perez-Celis, Jordan Anderson,Michael Wirthlin,William Rice
2018 IEEE RADIATION EFFECTS DATA WORKSHOP (REDW)pp.275-282, (2018)
Cited31Views0EIWOSBibtex
31
0
Assuring Robust Triple-Modular Redundancy Protected Circuits In Sram-Based Fpgas
Heather M. Quinn,Keith S. Morgan,Paul S. Graham, James B. Krone,Michael P. Caffrey, Kevin Lundgreen,Brian Pratt,David Lee,Gary M. Swift,Michael J. Wirthlin
IONIZING RADIATION EFFECTS IN ELECTRONICS: FROM MEMORIES TO IMAGERS (2016)
Cited0Views0Bibtex
0
0
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Author Statistics

#Papers: 12

#Citation: 253

H-Index: 6

G-Index: 10

Sociability: 4

Diversity: 1

Activity: 0

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