Dong Jin Jung

Dong Jin Jung received his B.S. (1990) and M.S. (1992) degrees in electronic materials engineering from the Kwangwoon University in South Korea. He was awarded the highest honor student by the university in 1990. After his M.S. program, he joined the Semiconductor R&D Center of Samsung Electronics, where he served as an engineer on a project of developing MOSFET technologies from 1992 to 1994. He subsequently joined a team to research and develop ferroelectric random access memories (FRAMs) in Samsung and served as a device engineer (a starting member) for seven years after 1995. During the FRAM project, he played a key role in developing device technologies for highly scalable and reliable FRAMs. In 2001 he was also awarded a Samsung Scholarship prize and moved to Cambridge, UK, where he joined Prof. J. F. Scott's group to pursue study in an area of ferroelectric physics. He is currently a Ph.D. student under Dr. Scott's supervision in the University of Cambridge, UK, and also a senior research engineer in Samsung.