谷歌浏览器插件
订阅小程序
在清言上使用
VIPCreated with Sketch.
研究兴趣

论文共 11 篇作者统计合作学者相似作者

按年份排序按引用量排序主题筛选期刊级别筛选合作者筛选合作机构筛选
时间
引用量
主题
期刊级别
合作者
合作机构
Combine TEM with TCAD Simulation - A Novel Approach in Failure Analysis
Yu Zhang,Satish Kodali,Edmund Banghart,Travis Mitchell,Frieder Baumann
Microscopy and Microanalysisno. S1 (2021): 1548-1549
引用0浏览0引用
0
0
Yield and Failure Analysis of FinFET Source to Drain Leakage in 12nm Technology
Felix Beaudoin,Satish Kodali, Rohan Deshpande,Wayne Zhao,Edmund Banghart,Rinus Lee, Thirukumaran Mahalingam, Nuh Yuksek, Lu Yuan, Wang Tao,Lillian Li, Sushruth Goud Perumalla, Shweta Arora,Trejo Rust
International Symposium for Testing and Failure Analysis ISTFA 2020 Papers Accepted for the Planned 46th International Symposium for Testing and Failure Analysis (2020)
引用0浏览0引用
0
0
Capacitance Characterization of Gate to LDD Overlap Region to Understand Subtle Fail Modes in Advanced Node Technologies
Satish Kodali,Edmund Banghart,Kevin Davidson, Yu Zhang,Jagar Singh,Chong Khiam Oh
International Symposium for Testing and Failure Analysis ISTFA 2019 Conference Proceedings from the 45th International Symposium for Testing and Failure Analysis (2019)
引用0浏览0引用
0
0
加载更多
作者统计

#Papers: 11

#Citation: 81

H-Index: 5

G-Index: 8

Sociability: 4

Diversity: 2

Activity: 0

  • 合作者
  • 学生
  • 导师
暂无相似学者，你可以通过学者研究领域进行搜索筛选
数据免责声明
页面数据均来自互联网公开来源、合作出版商和通过AI技术自动分析结果，我们不对页面数据的有效性、准确性、正确性、可靠性、完整性和及时性做出任何承诺和保证。若有疑问，可以通过电子邮件方式联系我们：report@aminer.cn