Harmes, M.

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Michael C. Harmes is a Senior Technician in Intel's Components Research Department, Hillsboro, OR, and has been with the Intel Corporation for 20 years. His work has focused in the area of electrical characterization of ICs using testers and test systems, and has included RAMS, DRAMS, microcontrollers, PLDs, microprocessors, and telecommunication products. His present responsibilities include development and support of novel electrical testing for advanced interconnects.

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