Tim Houben - Eindhoven Univ Technol | 人才画像

基本信息

Career Trajectory

Bio

PhD candidate at TU/e and ASML Research. Applying state of the art machine learning techniques to Scanning Electron Microscopy for 3D surface reconstruction of semiconductor devices.

Research Interests

Papers共 10 篇Author StatisticsCo-AuthorSimilar Experts

By YearBy Citation主题筛选期刊级别筛选合作者筛选合作机构筛选

IndustReal: A Dataset for Procedure Step Recognition Handling Execution Errors in Egocentric Videos in an Industrial-Like Setting

Tim J. Schoonbeek,Tim Houben,Hans Onvlee,Peter H. N. de With,Fons van der Sommen

IEEE/CVF Winter Conference on Applications of Computer Visionpp.4353-4362, (2024)

Cited1Views0EIWOSBibtex

Supervised Representation Learning Towards Generalizable Assembly State Recognition

Tim J. Schoonbeek, Goutham Balachandran,Hans Onvlee,Tim Houben, Shao-Hsuan Hung, Jacek Kustra,Peter H. N. de With,Fons van der Sommen

IEEE Robotics Autom Lettno. 11 (2024): 9915-9922

Cited0Views0EIWOSBibtex

Proceedings of the Workshop on 3D Geometry Generation for Scientific Computing

Marissa Ramirez de Chanlatte,Phil Colella,Trevor Darrell,Alexandra Katherine Carlson,Peter H. N. de With,Huayu Deng,Shanyan Guan,James Hays,Tim Houben,Thomas Huisman,Nikita Jaipuria,Hans Johansen,Shuja Khalid,Akshay Krishnan,Chuming Li,Maxim Pisarenco,Amit Raj, Frank Rudzicz,Tim J. Schoonbeek, Sandhya Sridhar,Nathan Tseng,Fons van der Sommen, Chen Wang,Yunbo Wang, Tong Wu,Xiaokang Yang,Jiawei Yao, Derek Young,Xianling Zhang

2024 IEEE WINTER CONFERENCE ON APPLICATIONS OF COMPUTER VISION WORKSHOPS, WACVW 2024pp.762-766, (2024)

Cited0Views0EIWOSBibtex

Depth Estimation from SEM Images Using Deep Learning and Angular Data Diversity

Tim Houben,Maxim Pisarenco,Thomas Huisman,Hans Onvlee,Fons van der Sommen,Peter de With

METROLOGY, INSPECTION, AND PROCESS CONTROL XXXVII (2023)

Cited1Views0Bibtex

Training Procedure for Scanning Electron Microscope 3D Surface Reconstruction Using Unsupervised Domain Adaptation with Simulated Data

Tim Houben,Thomas Huisman,Maxim Pisarenco,Fons van der Sommen,Peter de With

JOURNAL OF MICRO-NANOPATTERNING MATERIALS AND METROLOGY-JM3（2023）

Cited4Views0Bibtex

Depth Estimation from a Single CD-SEM Image Using Domain Adaptation with Multimodal Data

Tim Houben,Thomas Huisman,Maxim Pisarenco,Fons van der Sommen,Peter de With

Fourteenth International Conference on Machine Vision (ICMV 2021)（2022）

Cited0Views0EIBibtex

Depth Estimation from a Single SEM Image Using Pixel-Wise Fine-Tuning with Multimodal Data

Houben Tim,Huisman Thomas,Pisarenco Maxim,van der Sommen Fons,de With Peter H. N.

Machine vision and applications（2022）

Cited13Views0EIBibtex

One-class Gaussian Process Regressor for Quality Assessment of Transperineal Ultrasound Images

Saskia Maria Camps,Tim Houben,Davide Fontanarosa,Christopher Edwards,Maria Antico,Matteo Dunnhofer, Esther G.H.J. Martens,Jose A. Baeza,Ben G.L. Vanneste,Evert J. van Limbergen,Peter H.N. de With,Frank Verhaegen,Gustavo Carneiro

MIDL 2018 (2018)

Cited5Views0Bibtex

Entwicklung Eines Batteriemanagementsystems

Rafael Garayoa Guajardo,Jeroen Maar,Tim Houben,Patrick Bens

ATZextrano. 3 (2013): 62-69

Cited23Views0Bibtex

Automatic Deep Learning Based Quality Assessment of Transperineal Ultrasound Guided Prostate Radiotherapy

Saskia Camps,Tim Houben,Gustavo Carneiro, C. Edwards,Maria Antico,Matteo Dunnhofer, Esther Martens,J.A. Baeza,Ben Vanneste,Evert J. Van Limbergen,Frank Verhaegen,Davide Fontanarosa

semanticscholar

Cited0Views0Bibtex

Author Statistics

Co-Author

Co-Institution

D-Core

合作者
学生
导师

No result temporarily, you can search similar Scholar with the same research interest

Data Disclaimer

The page data are from open Internet sources, cooperative publishers and automatic analysis results through AI technology. We do not make any commitments and guarantees for the validity, accuracy, correctness, reliability, completeness and timeliness of the page data. If you have any questions, please contact us by email: report@aminer.cn