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Papers共 110 篇Author StatisticsCo-AuthorSimilar Experts
By YearBy Citation主题筛选期刊级别筛选合作者筛选合作机构筛选
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Chen Zhang, SeungMin Song,Jay Strane, Lijuan Zou, Seungchan Yun, Keumseok Park, Abir Shadman, Jaehong Lee, WuKang Kim, Utkarsh Bajpai, Larry Zhuang, Shahrukh Khan, Wai Kin Li,Shogo Mochizuki,Takashi Ando,Shay Reboh, Debarghya Sarkar, Myung Yang, Myunghoon Jung,Tsung-Sheng Kang, Ilhom Saidjafar, Nate Putnam,Shanti Pancharatnam,Muthumanickam Sankarapandian, Erik Milosevic, Junmo Park, Kishwar Mashooq, Prabudhya R. Chowdhury, Jim Mazza, Nick Lanzillo, Sarah N. Chowdhury, Yeojin Lee,Paul Jamison, Matt Malley, Pinlei Chu, Jeonghyun Hwang, Mohsen Nasseri, Kibyung Park, Namkyu Cho, Jongmin Shin, Inwon Park, Thanh Nguyen, Beomjin Park, Feng Liu, Shivani Kumar, Cliff Osborn,Juntao Li, Lukas Tierney,James Demarest, Junli Wang,Eric Miller, Susan Fan, Jingyun Zhang, Yu Zhu,John Arnold,Tenko Yamashita,Dan Dechene,Kang-Ill Seo,Dechao Guo,Huiming Bu
2024 IEEE International Electron Devices Meeting (IEDM)pp.1-4, (2024)
International Symposium for Testing and Failure Analysis ISTFA 2024 Conference Proceedings from the 50th International Symposium for Testing and Failure Analysis (2024): 79-81
Zachary Gardner,Soon-cheon Seo, Pijeng Khor, Chris Waskiewicz,M. Sankarapandian,Eric Perfecto,James Demarest
2024 35TH ANNUAL SEMI ADVANCED SEMICONDUCTOR MANUFACTURING CONFERENCE, ASMC (2024)
openalex(2023)
S.-C. Fan,P. Jamison,S. Pancharatnam,M. Sankarapandian,R. Xie,C. Waskiewicz,J. Strane, J. Lee,H. Shobha,J. Demarest, C. Peethala,H. Jagannathan, J. Wynne
2023 34th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) (2023)
2023 34th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)pp.1-4, (2023)
Geoffrey W. Burr,Pritish Narayanan,Stefano Ambrogio,Atsuya Okazaki,Hsinyu Tsai,Kohji Hosokawa,Charles Mackin,Akiyo Nomura,Takeo Yasuda,J. Demarest,Kevin Brew,Victor Chan,Samuel Choi,T. Gordon,T. M. Levin,Alexander M. Friz,Masatoshi Ishii,Yasuteru Kohda,An Chen,Andrea Fasoli,Jose Luquin,Nicole Saulnier,S. Teehan,Ishtiaq Ahsan,Vijay Narayanan
2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) (2023)
S.-C. Fan,P. Jamison,S. Pancharatnam,M. Sankarapandian,R. Xie,C. Waskiewicz,J. Strane, J. Lee,H. Shobha,J. Demarest, C. Peethala,H. Jagannathan, J. Wynne
2023 34th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)pp.1-3, (2023)
G. Tsutsui,S. Song,J. Strane,R. Xie, L. Qin,C. Zhang, D. Schmidt,S. Fan, B. Hong,Y. Jung,C-W. Sohn,I. Hwang, J. Yim, G. H. Son, G. Jo,K-I. Kim,M. Sankarapandian,S. Mochizuki,I. Seshadri,E. Miller,J. Li,J. Demarest,C. Waskiewicz,R. G. Southwick,H. Zhou,R. N. Pujari, P. Nieves,M. Wang,H. Jagannathan,B. Anderson,D. Guo,R. Divakaruni,T. Wu,K-I. Seo,H. Bu
2022 International Electron Devices Meeting (IEDM) (2022)
J. Demarest,N. Arnold,K. Brew,V. Chan, A. Cote,T. Gordon, M. Iwatake,G. Lian, J. Li,I. OK,S. McDermott,I. Saraf,N. Saulnier,L. Tierney, A. Varghese
International Symposium for Testing and Failure Analysis ISTFA 2021 Conference Proceedings from the 47th International Symposium for Testing and Failure Analysis (2021)
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Author Statistics
#Papers: 110
#Citation: 1741
H-Index: 25
G-Index: 38
Sociability: 7
Diversity: 2
Activity: 1
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