Jerome Meilhan

Jérôme Meilhan is graduated engineer in Physics from the ENSPG School of the Institut National Polytechnique de Grenoble. After a training period at the ONERA on non-destructive characterization method using EM topology, in 2004, he joined the CEA-LETI, Grenoble, France, to work on inverse problem applied to carrier characterization in optoelectronic semiconductors. Since 2007, he is responsible of un-cooled infrared detectors system modeling and electro-optical characterizations in the Optronics Department of CEA-LETI. First this activity took place in close collaboration with ULIS, but since 2008, his activity is focused on the bolometer array developments for THz imaging