Jonathan Ahlbin (S'04–M'12) received the Ph.D. degree in electrical engineering from Vanderbilt University, Nashville, TN, USA, in 2012. He is a Senior Electrical Engineer with the Information Sciences Institute, University of Southern California, Los Angles, CA, USA, in the Disruptive Electronics group, where he specializes in microelectronic circuit design and analysis. In particular, he models and tests circuits for wearout mechanisms and for reliability in soft error prolific environments. He has published over 30 papers in peer-reviewed publications and presented at multiple international conferences. His current research interests include predicting the reliability of unknown counterfeit circuits and understanding the vulnerabilities of subthreshold circuits in extreme space environments. Dr. Ahlbin is on the Technical Committees for GOMACTech and the IEEE S3 Conferences. He is also an active reviewer for IEEE Nuclear and Space Radiation Effects Conference and for IEEE Transactions on Nuclear Science, IEEE Transactions on Computer Aided Design of Integrated-Circuits, and IEEE Transactions on Device and Materials Reliability.