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Papers共 53 篇Author StatisticsCo-AuthorSimilar Experts
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Optical and EUV Nanolithography XXXVI (2023)
V. Vega-Gonzalez,D. Montero,J. Versluijs,O. Varela Pedreira,N. Jourdan,H. Puliyalil,B. Chehab, T. Peissker, A. Haider,D. Batuk,G. T. Martinez,J. Geypen,Q. T. Le,N. Bazzazian,N. Heylen, M. van der Veen,Z. El-Mekki,T. Webers, H. Vats,L. Rynders,M. Cupak,J. Uk-Lee,Y. Drissi, L. Halipre,W. Gillijns,A-L Charley,P. Verdonck,T. Witters, S. Gompel,Y. Kimura,I Ciofi,B. De Wachter,J. Swerts,E. Grieten,M. Ercken,R. Kim,K. Croes,P. Leray,M. Jaysankar,N. Nagesh, L. Ramakers,G. Murdoch,S. Park,Z. Tokei, E. Dentoni-Litta,N. Horiguchi
2021 IEEE International Interconnect Technology Conference (IITC) (2021)
Zs Tokei, V. Vega,G. Murdoch, M. O'Toole,K. Croes,R. Baert,M. Van der Veen,C. Adelmann,J. P. Soulie,J. Boemmels,C. Wilson,S. H. Park,K. Sankaran,G. Pourtois, J. Sweerts,S. Paolillo,S. Decoster,M. Mao,F. Lazzarino,J. Versluijs, V Blanco,M. Ercken,E. Kesters,Q-T Le,F. Holsteyns,N. Heylen,L. Teugels,K. Devriendt,H. Struyf,P. Morin,N. Jourdan,S. Van Elshocht,I Ciofi,A. Gupta,H. Zahedmanesh,K. Vanstreels,M. H. Na
V. Vega-Gonzalez,H. Puliyalil,J. Versluijs,A. Lesniewska, O. Varela-Pereira,R. Baert,S. Paolillo,S. Decoster,F. Schleicher,D. Montero,J. Bekaert,E. Kesters,Q. T. Le,C. Lorant,L. Teugels,N. Heylen,N. Jourdan,Z. El-Mekki,M. van der Veen,I Ciofi,B. Briggs,J. Heijlen, L. Dupas,B. De-Wachter,E. Vancoille,T. Webers, H. Vats,L. Rynders,M. Cupak,J. Uk-Lee,Y. Drissi, L. Halipre,A-L Charley,P. Verdonck,T. Witters, S. Gompel,Y. Kimura, I Demonie,F. Lazzarino,M. Ercken,R. Kim,D. Trivkovic,K. Croes,P. Leray,M. Jaysankar,C. Wilson, G. Muroch,Z. Tokei
A. Veloso,E. Simoen, A. Oliveira,A. Chasin, S.-C. Chen, Y. Lin,T. Miyashita, M. Kim,D. Jang,R. Ritzenthaler, X. Zhou,H. Mertens,V. Pena,G. Santoro,K. Kenis,F. Sebaai,G. Mannaert,K. Devriendt,T. Hopf,J.J. Versluijs,O. Richard,J. Machillot, N. Yoshida,N. Horiguchi
Extended Abstracts of the 2019 International Conference on Solid State Devices and Materials (2019)
V. Vega-Gonzalez,C. J. Wilson,B. Briggs,S. Decoster,J. Versluijs,A. Lesniewska,S. Paolillo,R. Baert,H. Puliyalil,J. Bekaert,E. Kesters,Q. T. Le,C. Lorant, O. P. Varela,L. Teugels,N. Heylen,Z. El-Mekki,M. van der Veen,T. Webers, H. Vats,L. Rynders,M. Cupak,J. Uk-Lee,Y. Drissi, L. Halipre,A. -L. Charley,P. Verdonck,T. Witters, S. V. Gompel,Y. Kimura,N. Jourdan,I. Ciofi,A. Gupta,A. Contino,G. Boccardi,S. Lariviere, L. Dupas,B. De-Wachter,E. Vancoille,F. Lazzarino,M. Ercken,P. Debacker,R. Kim,D. Trivkovic,K. Croes,P. Leray, L. Dillemans, Y. -F. Chen,Z. Tokei
Stephane Lariviere,Christopher J. Wilson, Bogumila Kutrzeba Kotowska,Janko Versluijs,Stefan Decoster,Ming Mao,Marleen H. van der Veen,Nicolas Jourdan,Zaid El-Mekki,Nancy Heylen,Els Kesters,Patrick Verdonck,Christophe Beral,Dieter Van den Heuvel,Peter De Bisschop,Joost Bekaert,Victor Blanco,Ivan Ciofi,Danny Wan,Basoene Briggs,Arindam Mallik,Eric Hendrickx,Ryoung-han Kim,Greg McIntyre,Kurt Ronse,Juergen Boemmels,Zsolt Tokei,Dan Mocuta
EXTREME ULTRAVIOLET (EUV) LITHOGRAPHY IX (2018)
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Author Statistics
#Papers: 53
#Citation: 731
H-Index: 12
G-Index: 26
Sociability: 6
Diversity: 2
Activity: 0
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