Jo Janghyun - Department of Materials Science and Engineering and Research Institute of Advanced Materials, Seoul National University

Microscopy and microanalysis the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canadano. Supplement_1 (2023): 1304-1305

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Correlation Between Electronic Structure, Microstructure, and Switching Mode in Valence Change Mechanism Al2O3/TiOx‐Based Memristive Devices

Stephan Aussen,Felix Cueppers,Carsten Funck,Janghyun Jo,Stephan Werner,Christoph Pratsch,Stephan Menzel,Regina Dittmann,Rafal Dunin-Borkowski,Rainer Waser,Susanne Hoffmann-Eifert

ADVANCED ELECTRONIC MATERIALSno. 12 (2023)

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Screening of Coatings for an All-Solid-State Battery Using in Situ Transmission Electron Microscopy

Shibarata Basak,Junbeom Park,Janghyun Jo,Osmane Camara,Amir H. Tavabi,Hermann Tempel,Hans Kungl,Chandramohan George,Rafal E. Dunin-Borkowski,Joachim Mayer, Ruediger-A Elchel

Journal of Visualized Experiments（2023）

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Quantitative Electric Field Mapping Between Electrically Biased Needles by Scanning Transmission Electron Microscopy and Electron Holography

Jean Felix Dushimineza,Janghyun Jo,Rafal E. Dunin-Borkowski,Knut Mueller-Caspary

ULTRAMICROSCOPY（2023）

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