Jeong Won Kim

Jeong Won Kim was born in Cheongju, Korea, in 1968. He received the Ph.D. degree in chemistry from Korea Advanced Institute of Science and Technology, Daejeon, Korea, in 1997. From 1997 to 2000, he was a Process Engineer with Hynix Semiconductor, Inc. He then moved to the Department of Physics, Yonsei University, Seoul, Korea, as a Research Associate. In 2002, he was a Humboldt Fellow with Fritz-Haber Institute, Berlin, Germany, where he carried out synchrotron-based photoemission experiments on various solid surfaces. Since December 2004, he has been a Staff Scientist with Korea Research Institute of Standards and Science, Daejeon. His research interests include the measurement of interfacial electronic structures and carrier dynamics on organic thin films by photoelectron spectroscopic tools, and quantitative surface chemical analysis.