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Papers共 346 篇Author StatisticsCo-AuthorSimilar Experts

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Enhanced Memory Performance in Ferroelectric NAND Applications: the Role of Tunnel Dielectric Position for Robust 10-Year Retention
Prasanna Venkatesan,Andrea Padovani, Lance Fernandes, Priyankka Ravikumar,Chinsung Park, Huy Tran, Zekai Wang, Hari Jayasankar, Amrit Garlapati, Taeyoung Song, Hang Chen,Winston Chern, Zheng Wang, Kijoon Kim, Jongho Woog,Suhwan Lim, Kwangsoo Kim, Wanki Kim,Daewon Ha,Shimeng Yu, Suman Dattal,Luca Larcher,Gaurav Thareja, Asif Khanl
2025 IEEE International Reliability Physics Symposium (IRPS)pp.1-7, (2025)
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Multi-Scale Modeling-Driven Material to Device Co-Optimization of Ferroelectric Capacitors with Oxygen Reservoir Layer (ORL) for Improved Endurance
Andrea Padovani, Nashrah Afroze, Yu-Hsin Kuo, Priyankka Gundlapudi Ravikumar, Prasanna Venkatesan Ravindran,Mengkun Tian,Asif Khan, Jihoon Choi,Jun Hee Lee,Luca Larcher,Gaurav Thareja
2025 IEEE International Reliability Physics Symposium (IRPS)pp.1-6, (2025)
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Impact of Al-based Dipole Formation on Gate Stack Integrity and Reliability
Bruno Coppolelli, Davide Cornigli, Zheyuan Chen,Andrea Padovani, Sara Vecchi, Yanliu Dang, Luc Thomas, Luca Vandelli, Jianxin Lei, Naomi Yoshida, Renu Whig, Federico Nardi,Gaurav Thareja,Luca Larcher,Milan Pesic
2025 IEEE International Reliability Physics Symposium (IRPS)pp.01-08, (2025)
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Understanding Correlation Between Memory Window Closure, Leakage and Read Delay Effects for FEFET Reliability Improvement: Role of IL and FE Traps
Priyankka Ravikumar, Andrea Padovani, Prasanna Venkatesan,Chinsung Park, Nashrah Afroze,Mengkun Tian,Suman Datta,Shimeng Yu,Luca Larcher,Gaurav Thareja,Asif Khan
2025 IEEE International Reliability Physics Symposium (IRPS)pp.1-5, (2025)
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A Novel D2 Plasma Treatment for Defect Passivation: from Modeling to Process Optimization
Sara Vecchi, Vikram Bhosle,Andrea Palmieri, Davide Cornigli, Fabrizio Buscemi,Andrea Padovani, Deven Raj, Andrew Cockburn, Lucien Date,Gaurav Thareja, Federico Nardi,Luca Larcher
2025 IEEE International Reliability Physics Symposium (IRPS)pp.1-5, (2025)
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The Role of Carrier Injection in the Breakdown Mechanism of Amorphous Al2O3 Layers
P. La Torraca,A. Padovani, J. Strand,A. Shluger,L. Larcher
IEEE ELECTRON DEVICE LETTERSno. 2 (2024): 236-239
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Modeling GAA Nanosheet Devices Accounting for Quantum-Mechanical Effects Down to Cryo Temperature
Luca Larcher
2024 INTERNATIONAL VLSI SYMPOSIUM ON TECHNOLOGY, SYSTEMS AND APPLICATIONS, VLSI TSA (2024)
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Author Statistics

#Papers: 346

#Citation: 9679

H-Index: 49

G-Index: 87

Sociability: 7

Diversity: 3

Activity: 13

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