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Research Interests

Papers共 15 篇Author StatisticsCo-AuthorSimilar Experts

By YearBy Citation主题筛选期刊级别筛选合作者筛选合作机构筛选
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Correlative Microscopy: In-Situ AFM-in-SEM Introduction, Capabilities, and Case Studies Semiconductor Materials and Batteries
Jan Neuman,Radek Dao, Ondøej Novotný,Veronika Hegrová, Rosalinda Ring,Libor Strakoš, Lukáš Kormoš,Umberto Celano
International Symposium for Testing and Failure Analysis ISTFA 2024 Tutorial Presentations from the 50th International Symposium for Testing and Failure Analysis (2024)
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In-situ Correlative AFM-SEM Characterization for Failure Analysis
Jan Neuman,Radek Dao,Ondřej Novotný, Vojtěch Schánilec,Veronika Hegrová,Libor Strakoš,Tomáš Vystavěl,Umberto Celano
International Symposium for Testing and Failure Analysis ISTFA 2023 Tutorial Presentations from the 49th International Symposium for Testing and Failure Analysis (2023)
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Defect Localization and Analysis of Compound Semiconductors Using ECCI, CBED, and STEM-in-SEM for an All-In-Situ Workflow Using a FIB/SEM Microscope
Adam Stokes,Libor Strakoš,Trevan Landin
International Symposium for Testing and Failure Analysis ISTFA 2022 Conference Proceedings from the 48th International Symposium for Testing and Failure Analysis (2022)
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Application and Optimization of Automated ECCI Mapping to the Analysis of Lowly Defective Epitaxial Films on Blanket or Patterned Wafers
Han,Thomas Hantschel,Pieter Lagrain,Clement Porret,Roger Loo,Marina Baryshnikova,Bernardette Kunert,Libor Strakos,Tomas Vystavel
International Symposium for Testing and Failure Analysis ISTFA 2021 Conference Proceedings from the 47th International Symposium for Testing and Failure Analysis (2021)
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Author Statistics

#Papers: 15

#Citation: 60

H-Index: 4

G-Index: 6

Sociability: 4

Diversity: 1

Activity: 1

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