Nagarajan Raghavan's current research work focuses on prognostics and system health management, statistical characterization and reliability modeling of dielectric breakdown and resistive switching in novel high-κ dielectric materials. He has authored / co-authored around 220 publications to date and is a recipient of the IEEE Electron Device Society PhD Fellowship Award in 2011 and IEEE EDS Early Career Award in 2016. He is an Associate Editor for IEEE Access and MDPI Electronics.