基本信息
浏览量:40

个人简介
Shih-Hung Chen received the B.S. degree from the National Huwei Institute of Technology, Yunlin, Taiwan, R.O.C., in 2000, the M.S. degree from the National Chiao-Tung University (NCTU), Hsinchu, Taiwan, R.O.C., in 2002, and is currently working toward the Ph.D. degree in electronics engineering at the NCTU.
In 2002, he joined the ESD and Product Engineering Department, SoC Technology Center, Industrial Technology Research Institute, Taiwan, R.O.C., as a Product Engineer. His current research interests include on-chip ESD protection circuit design and product reliability of CMOS integrated circuits.
研究兴趣
论文共 140 篇作者统计合作学者相似作者
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Shih-Hung Chen, P-Y Fu,A. Tsiara,M. Van De Peer,M. Simicic, S. Musibau,Y. Ban,K. H. Kao, W-C Chen,K. Serbulova,J. Van Campenhout, Ph Absil,K. Croes
2024 46TH ANNUAL EOS/ESD SYMPOSIUM, EOS/ESD 2024 (2024)
ECS Transactionsno. 2 (2024): 13-24
Marko Simicic, Hiroshi Takenaka,Shinichi Tamura,Dieter Claes,Yohei Shimada,Masanori Sawada,Shih-Hung Chen
2024 46TH ANNUAL EOS/ESD SYMPOSIUM, EOS/ESD 2024 (2024)
IEEE Transactions on Electron Devicesno. 4 (2024): 2278-2283
2024 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM, IRPS 2024 (2024)
ECS Meeting Abstractsno. 21 (2024): 1290-1290
PROCEEDINGS OF THE IEEE 74TH ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE, ECTC 2024pp.754-759, (2024)
IEEE JOURNAL OF SOLID-STATE CIRCUITS (2024)
2024 46TH ANNUAL EOS/ESD SYMPOSIUM, EOS/ESD 2024 (2024)
International Symposium for Testing and Failure Analysis ISTFA 2023 Tutorial Presentations from the 49th International Symposium for Testing and Failure Analysis (2023)
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作者统计
#Papers: 140
#Citation: 2241
H-Index: 24
G-Index: 44
Sociability: 6
Diversity: 2
Activity: 4
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