Shehab E. Ali

The local structure of many materials is often the key to understanding their properties. The main theme underlying my research is in the determination of structures using X-ray absorption (XAS), emission (XES), and powder diffraction (XRD) techniques in complementary with the full-field transmission X-ray microscope (TXM). Structure underlies many of the properties of any system, and so is a vial starting point for any system studied.