Stephane Andrieu currently works at the Institut Jean Lamour , University of Lorraine. Stephane does research in Materials Physics, Solid State Physics and Surface Science. Stephane is a specialist of Crystal growth by Molecular Beam Epiaxy, with expertise in UHV characterization tools like electron diffraction (RHEED, LEED), Auger and XPS spectroscopies, x-ray photoemission, and scanning tunneling microscopy. He is also a regular user of synchrotron radiation source to characterize thin films (EXAFS, XMCD, Angle-resolved and Spin resolved photoemission, surface diffraction. His research is dedicated to spintronics, and works now on magnetic Heusler compounds.