基本信息
views: 42

Bio
Thomas Fritzsch received the Diploma degree (M.Sc.) in electrical engineering from the Dresden University of Technology, Dresden, Germany, in 1997.
Since 2001, he has been with the Fraunhofer Institute for Reliability and Microintegration, Berlin, Germany, where he is the Head of the group BeOL-, TSV- and Bump-Metallization and also a Research and Development Engineer and Project Manager in the field of advanced wafer level packaging solutions with a focus on pixel detector and sensor packaging applications.
Research Interests
Papers共 43 篇Author StatisticsCo-AuthorSimilar Experts
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R. J. Bootsman,D. P. N. Mul, M. Beikmirza, O. El Bouslani, D. Maassen, B. van Velzen, M. Rousstia, R. Koster,J. R. Gajadharsing,T. Fritzsch,Y. Shen,M. S. Alavi,L. C. N. de Vreede
2024 54TH EUROPEAN MICROWAVE CONFERENCE, EUMC 2024pp.23-26, (2024)
JOURNAL OF INSTRUMENTATIONno. 3 (2023)
F. Huegging,T. Fritzsch
Zenodo (CERN European Organization for Nuclear Research) (2023)
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Gia Ngoc Phung, Franz Josef Schmuekle,Ralf Doerner, Bernhard Kaehne,Thomas Fritzsch,Uwe Arz,Wolfgang Heinrich
Smart Systems Integration; 13th International Conference and Exhibition on Integration Issues of Miniaturized Systemspp.1-8, (2019)
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A. C. Abusleme Hoffman,G. Parès,T. Fritzsch,M. Rothermund,H. Jansen, K. Krüger,F. Sefkow,A. Velyka,J. Schwandt,I. Perić, L. Emberger,C. Graf,A. Macchiolo,F. Simon, M. Szalay,N. van der Kolk, H. Abramowicz,Y. Benhammou,O. Borysov,M. Borysova,A. Joffe,S. Kananov, A. Levy,I. Levy,G. Eigen,R. Bugiel,S. Bugiel, M. Firlej,T. A. Fiutowski,M. Idzik,J. Moroń,K. P. Świentek,P. Terlecki,P. Brückman de Renstrom,B. Turbiarz,T. Wojtoń, L. K. Zawiejski,E. Firu,V. Ghenescu,A. T. Neagu,T. Preda,I. Boyko,Yu. Nefedov,A. Rymbekova,A. Sapronov,G. Shelkov,A. Zhemchugov,A. Ruiz-Jimeno,I. Vila,E. Fullana,J. Fuster,P. Gomis Lopez, M. Perelló, M. A. Villarejo,M. Vos,J. Alozy,N. Alipour Tehrani,D. Arominski,R. Ballabriga Sune,F. Boyer,E. Brondolin,M. Buckland, M. Campbell,D. Dannheim,K. Dette,F. Duarte Ramos,N. Egidos Plaja,K. Elsener,A. Fiergolski, C. Fuentes Rojas, C. Grefe,D. Hynds,W. Klempt,I. Kremastiotis, J. Kröger,S. Kulis,E. Leogrande,L. Linssen,X. Llopart Cudie,A. Lucaci-Timoce,M. Munker,L. Musa,A. Nürnberg,F. -X. Nuiry,E. Perez Codina,H. Pernegger,M. Petrič,F. Pitters,T. Quast,S. Redford,P. Riedler,P. Roloff,A. Sailer,E. Santin,U. Schnoor,E. Sicking,K. Sielewicz, R. Simoniello,W. Snoeys,S. Spannagel,S. Sroka, R. Ström,P. Valerio, S. van Dam,E. van der Kraaij,T. Vǎnát,O. Viazlo,M. Vicente Barreto Pinto, M. A. Weber,M. Williams, K. Wolters,M. Benoit,G. Iacobucci,D M S Sultan,R. R. Bosley,T. Price,M. F. Watson,N. K. Watson,A. G. Winter,J. Goldstein,S. Green,J. S. Marshall, M. A. Thomson, B. Xu,G. Casse, J. Vossebeld, T. Coates,F. Salvatore,J. Repond,L. Xia,C. Kenney,A. Tomada
arXiv (Cornell University) (2019)
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Author Statistics
#Papers: 43
#Citation: 754
H-Index: 14
G-Index: 26
Sociability: 6
Diversity: 2
Activity: 0
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