基本信息
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Bio
Thomas Weimann received the Diploma and Ph.D. degrees in physics from Westfälischen Wilhelms-University Münster, Münster, Germany, in 1987 and 1995, respectively.
Since 1987, he has been with Physikalisch-Technische Bundesanstalt (PTB), the National Metrology Institute (NMI) of Germany, Brunswick, Germany. His task includes research and development in single-electron tunneling effect (SET), nanolithography, Ebeam-lithography, Josephson, voltage standard, nanomembranes, surface acoustic wave (SAW) devices, and graphene.
Research Interests
Papers共 181 篇Author StatisticsCo-AuthorSimilar Experts
By YearBy Citation主题筛选期刊级别筛选合作者筛选合作机构筛选
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SURFACE AND INTERFACE ANALYSISno. 2 (2025): 131-136
MEASUREMENT SCIENCE AND TECHNOLOGYno. 9 (2024)
APPLIED PHYSICS REVIEWSno. 2 (2024)
ADVANCED MATERIALS (2024)
Celina Bozena Hellmich, Lena Heinrich,Matthias Hemmleb,Sebastian Buetefisch,Thomas Weimann,Stefanie Kroker
Measurement Science and Technology (2024)
Celina Bozena Hellmich, Lena Heinrich,Matthias Hemmleb,Sebastian Buetefisch,Thomas Weimann,Stefanie Kroker
crossref(2024)
arXiv (Cornell University) (2023)
SMALL METHODSno. 10 (2023)
NATURE NANOTECHNOLOGYno. 7 (2023): 733-+
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Author Statistics
#Papers: 181
#Citation: 5520
H-Index: 41
G-Index: 69
Sociability: 7
Diversity: 3
Activity: 11
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