Tim Houben - Eindhoven Univ Technol | 人才画像

基本信息

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职业迁徙

个人简介

PhD candidate at TU/e and ASML Research. Applying state of the art machine learning techniques to Scanning Electron Microscopy for 3D surface reconstruction of semiconductor devices.

研究兴趣

论文共 10 篇作者统计合作学者相似作者

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IndustReal: A Dataset for Procedure Step Recognition Handling Execution Errors in Egocentric Videos in an Industrial-Like Setting

Tim J. Schoonbeek,Tim Houben,Hans Onvlee,Peter H. N. de With,Fons van der Sommen

IEEE/CVF Winter Conference on Applications of Computer Visionpp.4353-4362, (2024)

引用1浏览0EIWOS引用

Supervised Representation Learning Towards Generalizable Assembly State Recognition

Tim J. Schoonbeek, Goutham Balachandran,Hans Onvlee,Tim Houben, Shao-Hsuan Hung, Jacek Kustra,Peter H. N. de With,Fons van der Sommen

IEEE Robotics Autom Lettno. 11 (2024): 9915-9922

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Proceedings of the Workshop on 3D Geometry Generation for Scientific Computing

Marissa Ramirez de Chanlatte,Phil Colella,Trevor Darrell,Alexandra Katherine Carlson,Peter H. N. de With,Huayu Deng,Shanyan Guan,James Hays,Tim Houben,Thomas Huisman,Nikita Jaipuria,Hans Johansen,Shuja Khalid,Akshay Krishnan,Chuming Li,Maxim Pisarenco,Amit Raj, Frank Rudzicz,Tim J. Schoonbeek, Sandhya Sridhar,Nathan Tseng,Fons van der Sommen, Chen Wang,Yunbo Wang, Tong Wu,Xiaokang Yang,Jiawei Yao, Derek Young,Xianling Zhang

2024 IEEE WINTER CONFERENCE ON APPLICATIONS OF COMPUTER VISION WORKSHOPS, WACVW 2024pp.762-766, (2024)

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Depth Estimation from SEM Images Using Deep Learning and Angular Data Diversity

Tim Houben,Maxim Pisarenco,Thomas Huisman,Hans Onvlee,Fons van der Sommen,Peter de With

METROLOGY, INSPECTION, AND PROCESS CONTROL XXXVII (2023)

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Training Procedure for Scanning Electron Microscope 3D Surface Reconstruction Using Unsupervised Domain Adaptation with Simulated Data

Tim Houben,Thomas Huisman,Maxim Pisarenco,Fons van der Sommen,Peter de With

JOURNAL OF MICRO-NANOPATTERNING MATERIALS AND METROLOGY-JM3（2023）

引用4浏览0引用

Depth Estimation from a Single CD-SEM Image Using Domain Adaptation with Multimodal Data

Tim Houben,Thomas Huisman,Maxim Pisarenco,Fons van der Sommen,Peter de With

Fourteenth International Conference on Machine Vision (ICMV 2021)（2022）

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Depth Estimation from a Single SEM Image Using Pixel-Wise Fine-Tuning with Multimodal Data

Houben Tim,Huisman Thomas,Pisarenco Maxim,van der Sommen Fons,de With Peter H. N.

Machine vision and applications（2022）

引用13浏览0EI引用

One-class Gaussian Process Regressor for Quality Assessment of Transperineal Ultrasound Images

Saskia Maria Camps,Tim Houben,Davide Fontanarosa,Christopher Edwards,Maria Antico,Matteo Dunnhofer, Esther G.H.J. Martens,Jose A. Baeza,Ben G.L. Vanneste,Evert J. van Limbergen,Peter H.N. de With,Frank Verhaegen,Gustavo Carneiro

MIDL 2018 (2018)

引用5浏览0引用

Entwicklung Eines Batteriemanagementsystems

Rafael Garayoa Guajardo,Jeroen Maar,Tim Houben,Patrick Bens

ATZextrano. 3 (2013): 62-69

引用23浏览0引用

Automatic Deep Learning Based Quality Assessment of Transperineal Ultrasound Guided Prostate Radiotherapy

Saskia Camps,Tim Houben,Gustavo Carneiro, C. Edwards,Maria Antico,Matteo Dunnhofer, Esther Martens,J.A. Baeza,Ben Vanneste,Evert J. Van Limbergen,Frank Verhaegen,Davide Fontanarosa

semanticscholar

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