Dr. Hackley’s research emphasizes the use of innovative analytical concepts applied to nanotechnology-related measurement problems, combined with international and other-agency collaboration to achieve high-impact results. Principal techniques include multi-detector asymmetrical-flow field flow fractionation and electrospray-differential mobility analysis. He also leads efforts to produce nanotech reference materials that underpin metrology and commerce, and is a US delegate, subject matter expert, project leader and/or committee officer in international standards organizations, including ISO TC229 (Nanotechnologies), ISO TC24/SC4 (Particle Characterization), ASTM E56 (Nanotechnology) and the Organization for Economic Cooperation and Development (OECD) Testing Program for Manufactured Nanomaterials. Dr. Hackley is a member of the steering board for the International Symposium on Field- and Flow-based Separations, the advisory board for the journal Environmental Science: Nano, the Scientific Oversight Committee for the National Cancer Institute’s Nanotechnology Characterization Laboratory, US lead for the EU-US Nanomedicine Collaboratory, and is a Fellow of the Royal Society of Chemistry.