Xiaobin Yuan

Xiaobin Yuan (S'01-M'06) was born in Beijing, China, in 1978. He received the B.E. degree in electronic engineering from Tsinghua University, Beijing, China, in 2001 and the Ph.D. degree in electrical engineering from Lehigh University, Bethlehem, PA, in 2006. He is currently with IBM Microelectronics, Hopewell Junction, NY. His research interests include characterization and compact modeling of deep-submicrometer CMOS, RF/Microwave devices, and reliability modeling of RF microelectro-mechanical system (MEMS) devices. Dr. Yuan is a member of the IEEE Electron Devices Society and Microwave Theory and Techniques Society.