Xinqiang Yan (Member, IEEE) received the Ph.D. degree in particle physics and nuclear physics from the Institute of High Energy Physics, Chinese Academy of Sciences, in 2014. He joined the Radiofrequency (RF) Laboratory, Institute of Biophysics, Chinese Academy of Sciences, in 2011, where he developed RF coils and RF/analog circuits for 7 T and 9.4 T scanners. At the end of 2014, he moved to the Vanderbilt University Institute of Imaging Science, as a Postdoctoral Research Fellow. In 2016, he joined the Vanderbilt Faculty, as a Research Instructor. He is currently a Research Associate Professor with the Department of Electrical Engineering and Computer Science, Vanderbilt University, and the Department of Radiology, Vanderbilt University Medical Center. His research interests include enhancing RF and B0 homogeneity, expediting acquisition speed, mitigating motion artifacts, and amplifying the signal-to-noise ratio. His research pursuits revolve around the advancement of engineering solutions aimed at addressing the technical hurdles encountered in the realms of MRI. He was a recipient of the IEEE IMWS-BIO Best Student Paper Award in 2013 and the Summa Cum Laude Award and Magna Cum Laude Award of ISMRM.