Yaojun Zhang received the BS and MS degrees from the Department of Electrical Engineering, Shanghai Jiaotong University, Shanghai, China, in 2008 and the University of Pittsburgh, Pittsburgh, Pennsylvania, in 2010, respectively, both in electrical engineering. He is currently working toward the PhD degree in the ECE Department, University of Pittsburgh. His research mainly focuses on emerging non-volatile memory design for high performance, low power and scalable computer architectures, statistical reliability analysis of memory technology, and customized array and cell level circuit design for STT-RAM technology. He is a member of the IEEE.