Built-In Speed Grading with a Process-Tolerant ADPLL
16th Asian Test Symposium (ATS 2007)（2007）
关键词
binary search process,larger process variation,process monitoring,maximum operating speed,programmable clock generator,speed grading,underlying ADPLL,various clock signal,All-Digital Phase-Locked Loop,Built-In Speed Grading,Process-Tolerant ADPLL
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