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Structural and Electrical Response of Emerging Memories Exposed to Heavy Ion Radiation

Tobias Vogel,Alexander Zintler,Nico Kaiser,Nicolas Guillaume,Gauthier Lefevre,Maximilian Lederer,Anna Lisa Serra,Eszter Piros,Taewook Kim,Philipp Schreyer,Robert Winkler,Despina Nasiou,Ricardo Revello Olivo,Tarek Ali,David Lehninger,Alexey Arzumanov,Christelle Charpin-Nicolle,Guillaume Bourgeois,Laurent Grenouillet,Marie-Claire Cyrille,Gabriele Navarro,Konrad Seidel,Thomas Kaempfe,Stefan Petzold,Christina Trautmann,Leopoldo Molina-Luna,Lambert Alff

ACS Nano（2022）

Cited 10|Views52
Key words
ferroelectric random-access memory,hafnium oxide,phase-change memory,phase transitions,resistive random-access memory,swift heavy ions,4D-scanning transmission electron microscopy,automated crystal orientation mapping
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