Improved Data Reduction for Far‐Infrared/Submillimeter Polarimetry
PUBLICATIONS OF THE ASTRONOMICAL SOCIETY OF THE PACIFIC(2005)
Univ Chicago
Abstract
Fluctuations in atmospheric emission introduce noise and systematic errors into measurements of polarization at far‐infrared and submillimeter wavelengths. We describe a new analysis method that corrects for the bias and reduces the errors caused by the fluctuations. The method exploits repeated observations of a source and is especially effective on faint sources for which the polarized flux is on the same order as the atmospheric fluctuations.
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