Active Tester Interface Unit Design For Data Collection
ITC（2004）
关键词
64-pin bus device,data collection time,device performance board,device validation,active tester interface unit,data collection,ac measurement,high speed device,manual approach,high speed muxes,device characterization,time consuming,automatic test equipment
AI 理解论文
溯源树
样例
生成溯源树，研究论文发展脉络
Chat Paper
正在生成论文摘要