Multi-Channel Field-Effect Transistor (mcfet)—part II: Analysis of Gate Stack and Series Resistance Influence on the MCFET Performance
IEEE Transactions on Electron Devices（2009）
关键词
Gate leakage current,mobility,multichannel field-effect transistors (MCFETs),negative bias temperature instability (NBTI),R-series,2-D numerical simulation,3-D
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