Tests of the Radiation Hardness of VLSI Integrated Circuits and Silicon Strip Detectors for the SSC under Neutron, Proton, and Gamma Irradiation
Conference Record of the 1991 IEEE Nuclear Science Symposium and Medical Imaging Conference（2002）
关键词
gamma-ray effects,neutron effects,position sensitive particle detectors,proton effects,semiconductor counters,silicon,acceptor state creation,central tracking systems,charge trapping,double sided Si strip detectors,gamma irradiation,interstrip resistance,leakage current,neutron irradiation,proton irradiations,pulse shapes,radiation damage,single sided strip detectors
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