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Studies of Double-Sided, Double Metal Silicon Strip Detectors

JP ALEXANDER,CJ BEBEK,TE BROWDER,JA DOBBINS,SG GRAY,K HONSCHEID,CD JONES,N KATAYAMA,JS KATRIS,PC KIM,M SELEN,HM WORDEN,F WURTHWEIN,J GRONBERG,RJ MORRISON,DL HALE,C KORTE,S KYRE,HN NELSON,TK NELSON,C QIAO,DM SCHMIDT,DJ SPERKA,H TAJIMA,D CINABRO,S HENDERSON, LH MILLER,H YAMAMOTO,M ARTUSO,Z SOBOLEWSKI,D AKERIB,M CHADHA,S CHAN,DF COWEN,JS MILLER,R BALEST,JG SMITH

IEEE Conference on Nuclear Science Symposium and Medical Imaging（2003）

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Key words
capacitance measurement,position sensitive particle detectors,semiconductor counters,semiconductor device noise,AC coupled detectors,CLEO-II vertex detector,Si microstrip detector,capacitance,double-metal,double-sided,noise,polysilicon bias resistors,punch-through biasing,signal
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