A CMOS Active Pixel Sensor for Charged Particle Detection

HS Matis,F Bieser,S Kleinfelder,G Rai,F Retiere,HG Ritter,K Singh, SE Wurzel,H Wieman,E Yamamoto

2002 IEEE Nuclear Science Symposium Conference Record（2003）

引用 11|浏览3

关键词

CMOS image sensors,ion beam effects,leakage currents,position sensitive particle detectors,proton effects,silicon radiation detectors,CMOS active pixel sensor,RHIC,Si-SiO2,charged particle detection,leakage current,next-generation vertex detectors,radiation damage

AI 理解论文

溯源树

样例

生成溯源树，研究论文发展脉络

Chat Paper

正在生成论文摘要