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Seu Error Signature Analysis of Gbit/S Sige Logic Circuits Using A Pulsed Laser Microprobe

Akil K. Sutton,Ramkumar Krithivasan,Paul W. Marshall,Martin A. Carts,Christina Seidleck,Ray Ladbury,John D. Cressler,Cheryl J. Marshall,Steve Currie,Robert A. Reed,Guofu Niu, Barbara Randall,Karl Fritz,Dale McMorrow,Barry Gilbert

IEEE TRANSACTIONS ON NUCLEAR SCIENCE（2006）

Cited 18|Views2
Key words
built-in self-test,circuit level hardening,high-speed bit-error rate testing,pulsed laser testing,silicon-germanium (SiGe),single-event effects (SEU)
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