Total Ionizing Dose Characterization of the Calibration Circuit of Texas Instruments' ADC12D1600CCMLS, 12b, 3.2 GSPS Analog-to-Digital Converter
Radiation Effects Data Workshop（2013）
Key words
analogue-digital conversion,avionics,gamma-rays,radiation hardening (electronics),ADC12D1600CCMLS ADC,Texas Instruments,calibration circuit,gamma irradiation,high speed analog-digital converter,in situ testing,storage capacity 12 bit,total ionizing dose characterization
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