Soft X-ray Imaging of Thick Carbon-Based Materials Using the Normal Incidence Multilayer OpticsI. A. Artyukov,R. M. Feschenko,A. V. Vinogradov,Ye. A. Bugayev,O. Y. Devizenko,V. V. Kondratenko,Yu. S. Kasyanov,T. Hatano,M. Yamamoto,S. V. SavelievMicron（2010）引用 16|浏览0关键词Soft X-ray microscopy,Carbon window,X-ray multilayer mirror,Laser plasmaAI 理解论文溯源树样例生成溯源树，研究论文发展脉络Chat Paper正在生成论文摘要
