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ENDF/B-VII.0 Data Testing for Three Fast Critical Assemblies

D.E. Cullen, R.N. Blomquist,Peter N. Brown, C. Dean,Michael E. Dunn, Y Lee, E. M. Lent,R.E. MacFarlane, Scott A. McKinley,E.F. Plechaty,J.-Ch. Sublet

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Key words
Finite Element Analysis,Nuclear Data Library
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