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Impact of Backplane Configuration on the Statistical Variability in 22nm FDSOI CMOS

E. M. Bazizi, I. Chakarov,T. Herrmann,A. Zaka, L. Jiang, X. Wu,S. M. Pandey,F. Benistant,D. Reid,A. R. Brown,C. Alexander,C. Millar,A. Asenov

2015 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)（2015）

Cited 0|Views72
Key words
FDSOI,mismatch,variability,discrete doping
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