Effect of Transistor Density and Charge Sharing on Single-Event Transients in 90-Nm Bulk CMOS
IEEE transactions on nuclear science（2011）
Key words
Charge sharing,CMOS scaling,single event,single-event transient,soft error
AI Read Science
Must-Reading Tree
Example
Generate MRT to find the research sequence of this paper
Chat Paper
Summary is being generated by the instructions you defined