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An Easy Way to Quantify the Adhesion Energy of Nanostructured Cu/X (X = Cr, Ta, Mo, Nb, Zr) Multilayer Films Adherent to Polyimide Substrates

crossref(2016)

Cited 5|Views0
Key words
Uniaxial tensile testing,Nanostructured multilayer films,Flexible substrates,Buckling behaviors,Adhesion energy
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