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Signals Induced by Charge-Trapping in EDELWEISS FID Detectors: Analytical Modeling and Applications

Q. Arnaud,E. Armengaud,C. Augier,A. Benoit,L. Berge,J. Billard,J. Bluemer,T. de Boissiere,A. Broniatowski,P. Camus,A. Cazes,M. Chapellier,F. Charlieux,L. Dumoulin,K. Eitel,N. Foerster,N. Fourches,J. Gascon,A. Giuliani,M. Gros,L. Hehn,G. Heuermann,M. De Jesus,Y. Jin,A. Juillard,M. Kleifges,V. Kozlov,H. Kraus,C. Kefelian,V. A. Kudryavtsev,H. Le-Sueur,S. Marnieros,X-F. Navick,C. Nones,E. Olivieri,P. Pari,B. Paul,M-C. Piro,D. Poda,E. Queguiner,S. Rozov,V. Sanglard,B. Schmidt,S. Scorza,B. Siebenborn,D. Tcherniakhovski,L. Vagneron,M. Weber,E. Yakushev

Journal of Instrumentation（2016）

引用 7|浏览9
关键词
Charge induction,Detector modelling and simulations II (electric fields, charge transport, multiplication and induction, pulse formation, electron emission, etc),Cryogenic detectors,Dark Matter detectors (WIMPs, axions, etc.)
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