Total Ionizing Dose Effects on Ge Channel $p$FETs with Raised ${\rm Si}_{0.55}{\rm Ge}_{0.45}$ Source/Drain
IEEE Transactions on Nuclear Science（2015）
Key words
Radiation effects,Negative bias temperature instability,Leakage currents,Transconductance,Degradation,Field effect transistors
AI Read Science
Must-Reading Tree
Example
Generate MRT to find the research sequence of this paper
Chat Paper
Summary is being generated by the instructions you defined