Two-Photon Absorption Induced Single-Event Effects: Correlation Between Experiment and Simulation

Joel M. Hales,Nicolas J-H. Roche,Ani Khachatrian,Dale McMorrow,Stephen Buchner,Jeffrey Warner,Marek Turowski,Klas Lilja,Nicholas C. Hooten,En Xia Zhang,Robert A. Reed,Ronald D. Schrimpf

IEEE Transactions on Nuclear Science（2015）

Cited 15|Views13

Key words

CMOS,free-carrier absorption,free-carrier refraction,nonlinear optics,optical kerr effect,silicon,single-event effect (SEE),single-event upset (SEU),two-photon absorption

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