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Pulsed I-V on Tfets: Modeling and Measurements

Quentin Smets,Anne Verhulst,Ji-Hong Kim,Jason P. Campbell,David Nminibapiel,Dmitry Veksler,Pragya Shrestha,Rahul Pandey,Eddy Simoen,David Gundlach,Curt Richter,Kin P. Cheung,Suman Datta,Anda Mocuta,Nadine Collaert,Aaron V. -Y. Thean,Marc M. Heyns

IEEE TRANSACTIONS ON ELECTRON DEVICES（2017）

Cited 5|Views90

Key words

III-V,pulsed I-V,TAT,traps,tunnel-FET

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