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Investigation of Ionizing Transients by Femtosecond X-ray Source Ionization

M. P. Belova,L. N. Kessarinskiy,A. Y. Borisov,A. I. Chumakov,D. V. Boychenko,K. A. Ivanov,I. N. Tsymbalov,R. V. Volkov,A. B. Savel'ev

2017 IEEE 30th International Conference on Microelectronics (MIEL)（2017）

Cited 0|Views17
Key words
p-i-n diode,TW titanium:Sa femtosecond laser facility,operational amplifier,femtosecond X-ray source ionization,Ti
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