Characterization of Materials in the 50–750 GHz Range Using a Scatterometer

Tonny Rubaek,Per H. Nielsen,Cecilia Cappellin,Roger Appleby,Richard Wylde, Phil Atkin,E. Saenz

International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz)（2018）

TICRA | Roger Appleby MMW Consulting | Thomas Keating Ltd | Pixel Analyt | Estec

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Abstract

In this work we describe the design and operation of a scatterometer to be used at the European Space Agency. The instrument has the purpose to characterize smooth as well as rough materials, in transmission and reflection in the 50-750 GHz frequency range. We first discuss some of the design challenges encountered during the design, and later show some of the initial measured results.

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Key words

scatterometer,rough materials,smooth materials,frequency 50.0 GHz to 750.0 GHz

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