Electronics of Time-of-flight Measurement for Back-n at CSNS
T. Yu,P. Cao,X. Y. Ji,L. K. Xie,X. R. Huang,Q. An,H. Y. Bai,J. Bao, Y. H. Chen,P. J. Cheng,Z. Q. Cui,R. R. Fan,C. Q. Feng,M. H. Gu,Z. J. Han,G. Z. He,Y. C. He, Y. F. He,H. X. Huang,W. L. Huang,X. L. Ji,H. Y. Jiang,W. Jiang,H. T. Jing,L. Kang,B. Li,L. Li,Q. Li, X. Li, Y. Li,R. Liu,S. B. Liu,X. Y. Liu,G. Y. Luan,Y. L. Ma, C. J. Ning,J. Ren,X. C. Ruan,Z. H. Song, H. Sun, X. Y. Sun,Z. J. Sun,Z. X. Tan,J. Y. Tang,H. Q. Tang,P. C. Wang, Q. Wang,T. F. Wang, Y. F. Wang,Z. H. Wang,Z. Wang,J. Wen,Z. W. Wen,Q. B. Wu, X. G. Wu,X. Wu,Y. W. Yang,H. Yi,L. Yu,Y. J. Yu,G. H. Zhang,L. Y. Zhang,J. Zhang,Q. M. Zhang, Q. W. Zhang, X. P. Zhang,Y. T. Zhao,Q. P. Zhong, L. Zhou,Z. Y. Zhou,K. J. Zhu IEEE Transactions on Nuclear Science（2019）
关键词
Nuclear electronics,time stamp,time-of-flight (TOF) measurement
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