LFSR Generation for High Test Coverage and Low Hardware Overhead
IET Computers & Digital Techniques（2019）
关键词
polynomials,fault diagnosis,automatic test pattern generation,shift registers,integrated circuit testing,logic testing,pattern generator,linear feedback shift register,fault detection,Berlekamp-Massey algorithm,area overhead,complete ATPG set,nonconcatenated test sets,independent polynomial expressions,concatenated technique,nonconcatenated technique,LFSR generation,high test coverage,low hardware overhead,safety-critical technology,embedded system,polynomial size,automatic test PG test set,difficult-to-detect faults,test mapping,size 65,0 nm
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